R.F. Assis

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About

R.F. Assis is a prominent figure in the field of ion beam analysis (IBA), specializing in the development and application of external microbeam techniques for elemental mapping. Their major contribution lies in pioneering a method for high-resolution, non-destructive elemental mapping of large, delicate, or valuable samples—such as archaeological artifacts and cultural heritage objects—using an external ion beam. This approach, detailed in their highly cited 2018 paper "Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications" (15 citations), overcomes the limitations of traditional vacuum-based IBA by enabling in-air analysis of samples that cannot be placed in a chamber. Assis’s work has significantly advanced the portability and versatility of PIXE (Particle-Induced X-ray Emission) and other IBA techniques, allowing researchers to obtain spatially resolved compositional data with sub-millimeter precision. Their achievements have been instrumental in bridging materials science, archaeology, and conservation, providing a powerful tool for studying historical artifacts, geological specimens, and industrial materials. Through this innovation, Assis has established a lasting impact on the non-destructive analysis of complex, heterogeneous samples.