OTHER
Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications
Tiago Fiorini da Silva, C. L. Rodrigues, N. Added, M. A. Rizzutto, M.H. Tabacniks, A. Mangiarotti, Jessica Fleury Curado, Fernando Aguirre, Natasha F. Aguero, P. R. P. Allegro, P.H.O.V. Campos, Jennifer Restrepo, Gustavo F. Trindade, Mark R. Antonio, R.F. Assis, Alisson Rodolfo Leite
- Year
- 2018
- Citations
- 15
Keywords
MillimeterIon beam analysisSample (material)Range (aeronautics)Beam (structure)Ion beamOpticsComputer scienceImage resolutionResolution (logic)
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