OTHER
Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications
Tiago Fiorini da Silva, C. L. Rodrigues, N. Added, M. A. Rizzutto, M.H. Tabacniks, A. Mangiarotti, Jessica Fleury Curado, Fernando Aguirre, Natasha F. Aguero, P. R. P. Allegro, P.H.O.V. Campos, Jennifer Restrepo, Gustavo F. Trindade, Mark R. Antonio, R.F. Assis, Alisson Rodolfo Leite
- 发表年份
- 2018
- 引用次数
- 15
关键词
MillimeterIon beam analysisSample (material)Range (aeronautics)Beam (structure)Ion beamOpticsComputer scienceImage resolutionResolution (logic)
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