Tiago Fiorini da Silva

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About

Tiago Fiorini da Silva is a physicist specializing in the development and application of ion beam analysis (IBA) techniques for large-area, non-destructive elemental mapping. His major contributions lie in advancing external beam setups that allow sub-millimeter resolution mapping of cultural heritage objects, geological samples, and industrial materials—overcoming the size limitations of traditional vacuum-based methods. His most cited work, "Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications" (2018, 15 citations), demonstrates a breakthrough in combining Particle Induced X-ray Emission (PIXE) and Particle Induced Gamma-ray Emission (PIGE) for spatially resolved multi-element analysis. This work has been instrumental for applications in archaeology, art conservation, and materials science. Silva also played a key role in developing the external beam line at the Laboratory for Material Analysis with Ion Beams (LAMFI), a versatile facility that enables simultaneous PIXE and PIGE measurements. His research bridges instrumentation physics and applied science, offering researchers a powerful tool for non-invasive compositional mapping of large, fragile, or irregularly shaped objects.