Jessica Fleury Curado

Centro Universitário FEI, Universidade de São Paulo

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About

Jessica Fleury Curado is a specialist in ion beam analysis (IBA), with a primary focus on developing and applying external beam techniques for the elemental mapping of large samples. Her work centers on advancing the capabilities of Particle Induced X-ray Emission (PIXE) and Particle Induced Gamma-ray Emission (PIGE) to achieve sub-millimeter resolution across macroscopic areas. Her most cited paper, "Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications" (2018, 15 citations), details a versatile setup at the Laboratory for Material Analysis with Ion Beams (LAMFI) that integrates multiple detectors for comprehensive, non-destructive analysis. This contribution is significant for enabling high-resolution, multi-elemental imaging of objects that cannot be placed in a vacuum chamber, such as cultural heritage artifacts and large industrial components. Her earlier work, "Large areas elemental mapping by ion beam analysis techniques" (2015, 3 citations), laid the groundwork for these advancements. Through her research, Fleury Curado has expanded the practical utility of IBA, providing a powerful tool for materials science, archaeology, and environmental studies.