N. Added

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About

N. Added is a specialist in ion beam analysis, with a particular focus on the development and application of external beam techniques for elemental mapping. Their major contribution lies in advancing the capability to perform high-resolution, multi-technique analysis on large, delicate, or irregularly shaped samples that cannot be placed in a vacuum chamber. Their most cited work, "Elemental mapping of large samples by external beam ion beam analysis with sub-millimeter resolution and its applications" (2018, 15 citations), demonstrates a significant technical achievement, enabling sub-millimeter spatial resolution for Particle Induced X-ray Emission (PIXE) and Particle Induced Gamma-ray Emission (PIGE) measurements. This work, along with their earlier study on large-area mapping (2015), highlights the versatility of the external beam line at the Laboratory for Material Analysis with Ion Beams (LAMFI). By integrating multiple detectors for simultaneous PIXE, PIGE, and particle detection, Added has provided a powerful tool for non-destructive analysis in fields ranging from archaeology to materials science, establishing a practical method for obtaining detailed compositional maps from objects that were previously difficult to analyze.