Papers
2
Total Citations
23
H-Index
2
About
Yongjia Xu is a leading researcher in optical metrology and precision measurement, with a focus on advancing deflectometry and camera calibration techniques for complex surfaces. His major contributions include pioneering a novel calibration method for non-overlapping cameras using a mirrored absolute phase target, which significantly improves inspection accuracy in visual measurement systems and mobile robotics. This work, published in 2018, has garnered 19 citations and addresses a critical challenge in multi-camera setups. More recently, Xu introduced robotic near optical coaxial phase measuring stitching deflectometry (NCPMD) for form measurement of specular surfaces, a breakthrough for in-situ metrology in advanced manufacturing. This 2025 paper, with 4 citations, highlights his ability to combine accuracy, compact design, and lightweight hardware for real-world applications. Xu’s research is notable for its practical impact on engineering fields requiring high-precision surface inspection, such as aerospace and optics. His work on NCPMD, in particular, offers a promising solution for form measurement of reflective surfaces, demonstrating his expertise in phase measuring techniques and robotic integration. With a focus on bridging theoretical advances and industrial needs, Xu continues to shape the future of optical metrology.
Research Focus
Key Achievements
Top Papers
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