Wenrui Wu

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About

Wenrui Wu is a leading researcher in optical metrology and precision engineering, with a primary focus on advanced deflectometry techniques for form measurement of specular surfaces. His most notable contribution is the development of near optical coaxial phase measuring deflectometry (NCPMD), a groundbreaking method that enables in-situ, high-accuracy form measurement of reflective surfaces. This innovation offers significant advantages over traditional techniques, including compact design, lightweight instrumentation, and minimal measurement uncertainty—critical for advanced manufacturing in aerospace, optics, and semiconductor industries. Wu’s work addresses the growing demand for robust, portable metrology solutions in production environments. His 2025 paper on robotic near optical coaxial phase measuring stitching deflectometry, which has already garnered 4 citations, exemplifies his impact by integrating robotic automation with NCPMD for large-scale specular surface inspection. This achievement underscores his role in bridging precision metrology with industrial automation, positioning him as a key figure in the evolution of non-contact optical measurement. Wu’s research continues to shape the future of form metrology, offering practical tools for engineers and scientists tackling complex surface characterization challenges.