Tie Li

Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences

Papers

Total Citations

H-Index

About

Tie Li is a researcher whose work sits at the compelling intersection of nanorobotics, nanomaterial characterization, and micro-nano fabrication. Best known for pioneering automated approaches to handling two-dimensional materials, Li's most influential contribution — "Automated Mechanical Characterization of 2-D Materials using SEM based Visual Servoing" (2013, 35 citations) — addressed a critical bottleneck in the field by eliminating the reliance on manual feedback in nanorobotic systems. This work demonstrated that scanning electron microscope-based visual servoing could enable precise, automated manipulation of nanomaterials, opening new pathways for scalable nanomaterial processing. Complementing this, Li's earlier work on individual nanowire handling introduced a novel adhesive bond transfer technique capable of precisely positioning nanowires as thin as 100 nm across variable distances — a significant advance for NEMS device fabrication. More recently, Li has expanded into nanoscale sensing, exploring field emission-based diodes in silicon carbide and vanadium dioxide as promising components for smart sensor systems. Together, these contributions reflect a research trajectory focused on bringing automation, precision, and practical functionality to the challenging frontier of nanoscale science and engineering.