Sukhjinder Toor

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About

Dr. Sukhjinder Toor is a leading innovator in electromagnetic interference (EMI) source localization, with a primary research focus on advanced emission source microscopy (ESM) techniques. His most impactful contribution is the development of a sparse and nonuniform sampling methodology for ESM, which dramatically accelerates the imaging of EMI sources in complex, large-scale systems. This work, detailed in his highly cited 2017 paper (27 citations), overcomes the limitations of traditional, data-intensive uniform sampling, enabling rapid and accurate diagnosis of interference problems. By reducing the measurement burden while maintaining high-resolution imaging, Dr. Toor’s research provides a powerful tool for engineers tackling signal integrity and electromagnetic compatibility challenges in modern electronics. His innovative approach has significant implications for the design and troubleshooting of everything from consumer devices to aerospace systems, positioning him as a key figure in the evolution of practical, high-speed EMI diagnostics.