James L. Drewniak

Missouri University of Science and Technology

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About

James L. Drewniak is a leading authority in electromagnetic compatibility (EMC) and signal integrity, with his work fundamentally shaping how engineers manage electromagnetic interference (EMI) in complex electronic systems. His major contributions include pioneering the development of Emission Source Microscopy (ESM), a transformative technique for rapidly and accurately localizing EMI sources. His highly cited 2017 paper on "Sparse Emission Source Microscopy" introduced a breakthrough nonuniform sampling method that dramatically reduces measurement time while maintaining high-resolution imaging, enabling engineers to pinpoint interference sources in large, intricate systems that were previously impractical to diagnose. With over 27 citations on this seminal work alone, Drewniak’s research has had a profound impact on the design of high-speed digital devices and printed circuit boards. He is also widely recognized for his foundational work on power integrity and the modeling of ferrite beads and shielding. As a Distinguished Professor at the Missouri University of Science and Technology, Drewniak has mentored generations of EMC engineers and continues to drive innovation in near-field scanning and electromagnetic source reconstruction.