Victor Khilkevich

Missouri University of Science and Technology

Papers

Total Citations

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About

Victor Khilkevich is a leading researcher in electromagnetic compatibility (EMC) and near-field measurement techniques, with a particular focus on advancing emission source microscopy (ESM). His most-cited work, "Sparse Emission Source Microscopy for Rapid Emission Source Imaging" (2017, 27 citations), introduces a groundbreaking approach to localizing electromagnetic interference (EMI) sources in complex systems. By developing a sparse and nonuniform sampling technique, Khilkevich dramatically reduces the time and data required for traditional ESM, enabling faster and more efficient imaging of EMI sources without sacrificing accuracy. This innovation addresses a critical bottleneck in EMC diagnostics, where conventional methods demand dense, uniform sampling grids. His contributions have practical implications for industries ranging from consumer electronics to aerospace, where rapid identification of interference sources is essential for compliance and performance. Khilkevich’s work has been widely recognized within the EMC community, and his techniques are increasingly adopted in both academic research and industrial testing environments. For students and researchers exploring near-field imaging or EMI localization, his papers offer a clear path from theoretical principles to applied solutions.