P.H.O.V. Campos

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About

P.H.O.V. Campos is a materials physicist specializing in the development and application of ion beam analysis (IBA) techniques for the non-destructive elemental mapping of large-scale samples. His primary research focuses on advancing external beam setups that enable high-resolution, multi-technique analysis of cultural heritage objects, geological specimens, and industrial materials. Campos’s major contribution lies in demonstrating that sub-millimeter resolution elemental mapping can be achieved on large, irregularly shaped objects without requiring vacuum chambers—a significant practical breakthrough. His most cited work, “Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications” (2018, 15 citations), showcases this capability by integrating Particle Induced X-ray Emission (PIXE), Particle Induced Gamma-ray Emission (PIGE), and particle detection in a single external beam line at the Laboratory for Material Analysis with Ion Beams (LAMFI). This setup allows simultaneous multi-element detection, dramatically improving throughput and data richness. Though his citation counts are modest, Campos’s work is foundational for portable, in-air IBA systems, directly impacting conservation science and archaeometry. His 2015 paper on large-area mapping further established the versatility of LAMFI’s external beam line, making him a key figure in expanding IBA’s accessibility beyond traditional laboratory confines.