P. R. P. Allegro
Papers
2
Total Citations
18
H-Index
2
About
P. R. P. Allegro is a specialist in ion beam analysis, with a primary focus on the development and application of external beam techniques for large-area elemental mapping. Their major contributions center on advancing the capabilities of the Laboratory for Material Analysis with Ion Beams (LAMFI) external beam line, enabling high-resolution, multi-technique analysis of samples that cannot be placed in a vacuum. Allegro’s most cited work, “Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications” (2018, 15 citations), demonstrates a significant methodological improvement, achieving sub-millimeter resolution for mapping over large areas. This work, along with their earlier study on large-area mapping (2015), highlights their role in making ion beam techniques—such as Particle Induced X-ray Emission (PIXE) and Particle Induced Gamma-ray Emission (PIGE)—more practical for cultural heritage, environmental, and materials science applications. By integrating multiple detectors (X-ray, gamma-ray, and particle detectors) into a single, versatile setup, Allegro has helped bridge the gap between laboratory-based analysis and real-world, non-destructive testing of large or delicate objects.
Research Focus
Key Achievements
Top Papers
- 1
- 2Large areas elemental mapping by ion beam analysis techniques3 citations · 2015