Shuangquan Liu
Papers
1
Total Citations
2
H-Index
1
About
Shuangquan Liu has made pioneering contributions to non-destructive elemental analysis, with a primary focus on advancing micro X-ray fluorescence (μXRF) imaging technology. His most cited work, "Circular Imaging of Element Distribution Using Improved Surface Adaptive Micro X‐Ray Fluorescence Scanner" (2025, 2 citations), addresses a critical limitation in conventional μXRF systems—their inability to analyze curved or irregular surfaces. Liu’s key contribution lies in developing a surface-adaptive scanning mechanism that enables high-resolution, two-dimensional elemental mapping of non-flat objects, significantly expanding the applicability of μXRF in fields such as archaeology, materials science, and art conservation. By integrating circular imaging algorithms with adaptive surface tracking, his research improves both the accuracy and versatility of elemental distribution analysis. Though early in its citation trajectory, this work represents a notable technical achievement, offering a practical solution for non-destructive testing of complex geometries. Liu’s innovations are particularly valuable for researchers seeking to analyze cultural heritage artifacts or industrial components with uneven surfaces, positioning him as an emerging leader in analytical instrumentation and surface imaging methodologies.
Research Focus
Key Achievements
Top Papers
- 1