Long Wei

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About

Long Wei is pioneering the next generation of non-destructive elemental analysis, with a focused expertise in micro X-ray fluorescence (μXRF) imaging. His major contributions lie in overcoming a fundamental limitation of conventional μXRF: its restriction to flat surfaces. Long has developed advanced systems that enable high-resolution, three-dimensional elemental mapping on curved and irregular objects. His 2024 paper introducing a "3-D μXRF Imaging System for Curved Surface" and his 2025 work on a "Circular Imaging" method using an improved surface-adaptive scanner represent significant leaps forward. These innovations open new possibilities for analyzing artifacts, geological samples, and industrial components where surface topography previously prevented detailed inspection. While his most-cited papers currently hold 2 citations each, reflecting the very recent publication of this cutting-edge work, the foundational nature of these contributions signals strong future impact. Long Wei is establishing himself as a key innovator in expanding the practical applications of μXRF, making complex, non-planar samples accessible to high-resolution elemental analysis for the first time.