Qiong Xu

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About

Qiong Xu is a rising innovator in the field of non-destructive elemental analysis, with a primary focus on advancing micro X-ray fluorescence (μXRF) technology. Their major contributions lie in overcoming the traditional limitations of μXRF—specifically, its inability to scan curved or irregular surfaces. Xu pioneered the development of a 3-D μXRF imaging system for curved surfaces, enabling high-resolution, non-destructive elemental mapping on complex geometries. Building on this, they introduced an improved surface adaptive micro X-ray fluorescence scanner that achieves circular imaging of element distribution, significantly enhancing accuracy and versatility for real-world applications. Though early in their career, Xu’s work has already garnered citations, reflecting its immediate relevance to fields like materials science, archaeology, and industrial quality control. Their achievements represent a critical step toward making μXRF a truly flexible tool for three-dimensional and non-planar sample analysis. For students and researchers, Xu’s research exemplifies how creative engineering can expand the capabilities of established analytical techniques, opening new frontiers in surface and subsurface elemental characterization.