Jungsoon Shin
Papers
1
Total Citations
17
H-Index
1
About
Jungsoon Shin is a leading innovator in CMOS image sensor technology, with a primary focus on time-of-flight (ToF) sensors for advanced depth sensing. Her key research areas include indirect time-of-flight (iToF) image sensors, motion artifact suppression, and background light cancellation—critical challenges for real-world 3D imaging. Shin’s most notable contribution is her work on a dynamic pseudo 4-tap CMOS ToF image sensor, which achieves robust depth measurement even under extreme ambient light conditions exceeding 120 klux. This design, detailed in her highly cited 2020 paper (17 citations), integrates motion artifact suppression to enable accurate depth capture in dynamic scenes, a breakthrough for applications in autonomous navigation, augmented reality, and industrial robotics. Her research directly addresses the limitations of conventional iToF sensors by enhancing spatial resolution and reliability through scaled photodetectors. Shin’s work has been recognized for its practical impact, bridging the gap between high-performance sensing and real-world deployment. For students and researchers, her contributions exemplify how innovative circuit design can overcome environmental noise, making depth sensing more robust and accessible for next-generation imaging systems.
Research Focus
Key Achievements
Top Papers
- 1