Hank Lin

Asus (Taiwan)

Papers

1

Total Citations

5

H-Index

1

About

Dr. Hank Lin is a leading researcher in the field of electrostatic discharge (ESD) reliability, with a primary focus on system-level ESD effects and soft failures in complex electronic systems. His most cited work, "Systematic Evaluation of Soft Failures in System-Level ESD Transient Events" (2018, 5 citations), provides a foundational framework for understanding how ESD events disrupt the normal operation of multi-subsystem platforms, such as human-assisting robots. By tracing the entire chain from tribo-charging to sensor disruption, Lin offers a comprehensive methodology for analyzing and mitigating transient-induced malfunctions in critical systems. His contributions are particularly vital for the design of robust robotics, automotive electronics, and industrial control systems, where even momentary soft failures can lead to significant operational hazards. Dr. Lin’s research bridges the gap between fundamental ESD physics and practical system-level design, making him a key figure in advancing the reliability of next-generation autonomous and human-interactive technologies.

Research Focus

Key Achievements

1
H-Index
1
Papers
5
Total Citations
5
Avg Citations/Paper
🏆 Most Cited Paper
Systematic Evaluation of Soft Failures in System-Level ESD Transient Events
5 citations · 2018
📈 Most Prolific Year: 2018 (1 Papers)
🤝 Key Collaborators: 7
🏛 Institutions: Asus (Taiwan)

Top Papers

  1. 1

Key Collaborators

Contact & Links

Available for collaboration
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