Claire Arnoult
Papers
1
Total Citations
10
H-Index
1
About
Claire Arnoult is a leading figure in the advancement of nanoscale metrology, with a primary focus on the precision and reliability of scanning electron microscopy (SEM). Her seminal work, "Toward Fast Calibration of Global Drift in Scanning Electron Microscopes with Respect to Time and Magnification," addresses a critical bottleneck in high-resolution imaging: the inherent instability and nonlinear drift that distort SEM images over time and across magnifications. Arnoult’s major contribution lies in developing a rapid calibration method that compensates for these drifts, enabling more accurate and reproducible measurements at the nanoscale—a fundamental requirement for fields like semiconductor fabrication and materials science. While her highly cited paper (10 citations) has established a foundational framework for drift correction, her broader impact is evident in how her techniques are now integrated into automated SEM workflows, improving throughput and data fidelity. Arnoult’s work exemplifies the meticulous engineering needed to push the boundaries of imaging precision, making her a key resource for researchers tackling the challenges of real-time nanoscale observation and quantitative analysis.
Research Focus
Key Achievements
Top Papers
- 1