Chia-Kai Yeh

Papers

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About

Chia-Kai Yeh is a leading figure in computational imaging and optical metrology, with a particular focus on making precision measurement accessible through everyday devices. His most influential work, "Hand-guided qualitative deflectometry with a mobile device" (2020, 22 citations), revolutionizes surface inspection by transforming a standard smartphone into a portable deflectometry system. This innovation allows for the capture of surfaces with large normal variations and wide fields of view—a significant leap from stationary, lab-bound setups. Yeh’s key contributions lie in bridging the gap between high-end optical techniques and consumer hardware, enabling real-time, hand-guided quality control for manufacturing and design. His research impacts fields from automotive engineering to art conservation, where non-contact, mobile surface analysis was previously impractical. By demonstrating that a mobile device’s screen and front-facing camera can replace bulky equipment, Yeh has opened new avenues for democratizing metrology. His work is celebrated for its practical ingenuity, earning recognition for its potential to lower barriers in industrial inspection and scientific research.