Conductive atomic force microscopy

In-situ force microscopy to investigate fracture in stretchable electronics: insights on local surface mechanics and conductivity

Giorgio Cortelli, Luca Patruno, Tobias Cramer, Beatrice Fraboni, Stefano de Miranda

Citations: 8 • 2022

Atomic Force Microscopy Sensing Using Multiple Modes

Jiangbo Zhang, Ning Xi, Guangyong Li, Chanmin Su

Citations: 7 • 2006

Principles of nano-robotics based on atomic force microscopy

Khadijeh Daeinabi, Mohammad Teshnehlab

Citations: 3 • 2009

Automatic probe alignment for atomic force microscope

Shao-Kang Hung, Chia-Feng Tsai, Yu-Po Hsu, Dai-Jie Tzou, Meng-Hu Lin, Li‐Chen Fu

Citations: 2 • 2005

Geometric parameters effect of the atomic force microscopy smart piezoelectric cantilever on the different rough surface topography quality by considering the capillary force

Alireza Habibnejad Korayem, Mitra Taghizadeh, Moharam Habibnejad Korayem

Citations: 2 • 2018