Home /Research /High Precision Robotics System for Scanning Electron Microscopes
MANIPULATION

High Precision Robotics System for Scanning Electron Microscopes

S. Mazerolle, R. Rabe, S. Fahlbusch, Johann Michler, J.‐M. Breguet

Year
2004
Citations
5

Abstract

In this paper we present our latest developments in high precision positioning and handling systems operating inside an SEM. The Laboratory in Scanning Electron Microscope concept (LAB-in-SEM) is proposed along with a description of our piezodriven manipulators. Nano-material testing such as in-situ indentation and scratch have been conduct with our systems and are briefly related here. Finally, the preliminary tests of the tele-operated assembly of carbon nanotubes on AFM tips are described.These results will permit the development of an automatic nanotubes assembly system.

Keywords

Scanning electron microscopeScratchRoboticsNanotechnologyMicroscopeArtificial intelligenceManipulator (device)Carbon nanotubeMaterials scienceRobot

Related papers

Browse all MANIPULATION papers