Memory safety

Related papers: 1

Top Researchers

Peter G. Neumann

Institution: —

Robert N. M. Watson

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Hongyan Xia

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Jonathan Woodruff

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Hadrien Barral

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Lawrence Esswood

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Alexandre Joannou

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Robert Kovacsics

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David Chisnall

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Michael Roe

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Top Cited Papers

CheriRTOS: A Capability Model for Embedded Devices

Hongyan Xia, Jonathan Woodruff, Hadrien Barral, Lawrence Esswood, Alexandre Joannou, Robert Kovacsics, David Chisnall, Michael Roe, Brooks Davis, Edward Napierala, John Baldwin, Khilan Gudka, Peter G. Neumann, Alexander Richardson, Simon W. Moore, Robert N. M. Watson

Citations: 20 • 2018

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