Memory safety
相关论文数: 1
顶级研究者
最高引用论文
CheriRTOS: A Capability Model for Embedded Devices
Hongyan Xia, Jonathan Woodruff, Hadrien Barral, Lawrence Esswood, Alexandre Joannou, Robert Kovacsics, David Chisnall, Michael Roe, Brooks Davis, Edward Napierala, John Baldwin, Khilan Gudka, Peter G. Neumann, Alexander Richardson, Simon W. Moore, Robert N. M. Watson
引用数: 20 • 2018