Ellipsometry
Related papers: 7
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Silicon based affinity biochips viewed with imaging ellipsometry
Danny van Noort, Jens Rumberg, Edwin W. H. Jager, Carl‐Fredrik Mandenius
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Coloured TiO2 based glazing obtained by spray pyrolysis for solar thermal applications
Mihaela Dudită, Laura Manceriu, Mihai Anastasescu, Madalina Nicolescu, M. Gärtner
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Spectroscopic ellipsometry: a new tool for “on line” quality control
D. Zahorski, J. L. Mariani, L. Escadafals, Jean-Paul Gilles
Citations: 10 • 1993
Development of a Cluster Tool and Analysis of Deposition of Silicon Oxide by TEOSO<sub>2</sub> PECVD
Nilton Itiro Morimoto, Jacobus W. Swart
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Microwave Measurements for Conductive Anisotropic Materials
Nina Popovic, Evan A. Schlomann, Alec Weiss, Ross Rentz, Edward J. Garboczi, Nathan D. Orloff, Christian J. Long
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Ultra-Wideband Radar Diffraction Approximation for Dielectric Edges
B. Friederich, Thorsten Schultze, Ingolf Willms
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