Ellipsometry
相关论文数: 7
顶级研究者
最高引用论文
In Situ Monitoring of Optical Constants, Conductivity, and Swelling of PEDOT:PSS from Doped to the Fully Neutral State
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引用数: 39 • 2022
Silicon based affinity biochips viewed with imaging ellipsometry
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引用数: 24 • 2000
Coloured TiO2 based glazing obtained by spray pyrolysis for solar thermal applications
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引用数: 12 • 2013
Spectroscopic ellipsometry: a new tool for “on line” quality control
D. Zahorski, J. L. Mariani, L. Escadafals, Jean-Paul Gilles
引用数: 10 • 1993
Development of a Cluster Tool and Analysis of Deposition of Silicon Oxide by TEOSO<sub>2</sub> PECVD
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引用数: 8 • 1996
Microwave Measurements for Conductive Anisotropic Materials
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引用数: 6 • 2020
Ultra-Wideband Radar Diffraction Approximation for Dielectric Edges
B. Friederich, Thorsten Schultze, Ingolf Willms
引用数: 3 • 2015