Shih‐Yi Yuan

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About

Shih‐Yi Yuan is a leading researcher in electromagnetic interference (EMI) and side-channel security, specializing in the intricate relationship between software execution and electromagnetic emissions. His work bridges embedded systems, compiler design, and hardware security, with a focus on how machine code generated by different compilers and optimization options directly influences system-level EMI behavior. Yuan’s foundational 2018 study on compiler options’ effect on near-field EMI (5 citations) established a critical link between software choices and electromagnetic leakage, demonstrating that even the same program can produce vastly different emission profiles depending on compilation. He further advanced the field by developing an automated measurement platform integrating robotic arms with oscilloscopes (2019, 3 citations), enabling precise, repeatable EM-leakage analysis for information security applications. His 2017 method for estimating application-specific EMI on time-sharing operating systems (3 citations) provided a practical framework for isolating software-driven emissions in multitasking environments. More recently, Yuan has pioneered the use of neural networks to detect internal IC behaviors through electromagnetic side-channel leakage (2022), pushing the boundaries of non-invasive hardware analysis. His work has accumulated over 13 citations, establishing him as a key innovator in EMI-aware software design and electromagnetic side-channel security.