Feng-Chi Liu

Papers

Total Citations

H-Index

About

Dr. Feng-Chi Liu is a leading researcher in hardware security and electromagnetic (EM) side-channel analysis, with a focus on developing automated measurement platforms to detect internal integrated circuit behaviors. Their most-cited work, "Building an automated measurement platform for EM-Leakage analysis" (2022, 2 citations), introduces a novel system that combines a customized program, oscilloscope, and robotic arm to precisely capture EM side-channel leakage. This platform enables neural network-based detection of IC internal activities, advancing non-invasive security testing. Dr. Liu’s contributions lie in bridging automated EM measurement with machine learning, offering a scalable method to identify hardware vulnerabilities. While early in citation impact, their work represents a foundational step toward practical, high-throughput side-channel analysis. By reducing manual measurement overhead, Dr. Liu’s research empowers engineers to probe chip-level security flaws more efficiently, with implications for anti-tamper technologies and trusted hardware design. Their innovative integration of robotics and AI in EM leakage analysis marks a notable achievement in the field.