Hiroaki Shiratsuchi

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About

Hiroaki Shiratsuchi is a distinguished researcher in power electronics and semiconductor device characterization, with a particular focus on advanced imaging techniques for insulated-gate bipolar transistors (IGBTs). His most cited work, "IGBT chip current imaging system by scanning local magnetic field" (2013), pioneered a non-invasive method to visualize current distribution within IGBT chips by mapping local magnetic fields. This contribution addresses a critical challenge in power module reliability, enabling engineers to detect hotspots and uneven current flow that can lead to device failure. With 9 citations, this foundational paper has influenced subsequent studies in fault diagnosis and thermal management of high-power semiconductors. Shiratsuchi’s research bridges experimental physics and practical engineering, offering tools that enhance the design and longevity of power converters used in renewable energy systems, electric vehicles, and industrial motor drives. His work exemplifies how precise measurement techniques can unlock deeper insights into device behavior, making him a valuable resource for students and researchers exploring the intersection of magnetic field sensing and power electronics.