August Emil Tobiesen Stokkeland
Papers
1
Total Citations
8
H-Index
1
About
August Emil Tobiesen Stokkeland is a researcher whose work bridges materials science and electrical characterization, with a focus on the electrical properties of thin films on non-planar substrates. His key contributions center on developing novel measurement techniques for micron-scale systems, most notably demonstrated in his highly cited 2016 paper on electrical four-point probing of spherical metallic thin films coated onto polymer particles. This work addressed a critical gap in the field: the inability to measure the intrinsic resistivity of metal coatings on spherical particles without interference from contact resistance—a challenge that had hindered progress in conductive composites for electronic interconnects. By enabling accurate resistivity measurements, Stokkeland’s method provided a foundational tool for optimizing filler particles in advanced electronic materials. His research has garnered attention from the materials science community, with his most-cited work accumulating 8 citations, reflecting its niche but significant impact. Stokkeland’s achievement lies in solving a precise, practical problem that directly supports the development of more reliable and efficient conductive composites, making his work valuable for researchers and engineers working on next-generation electronic packaging and interconnect technologies.
Research Focus
Key Achievements
Top Papers
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