Principles of nano-robotics based on atomic force microscopy

Abstract

Nano-technology, which aims at the ideal miniaturization of devices and machines down to atomic and molecular sizes, has been a new topic as a promising high technology for the forthcoming century. By precise control of atoms, molecules or nano-scale objects, new sensors and manmade materials, tera-byte capacity memories, micro-scale robots and machines, quantum devices, micro-scale distributed intelligence system devices with integrated sensors, actuators and communication tools, etc., would be possible within the near future. Atomic Force Microscope (AFM) is primarily a tool for characterizing surface topography, but there is also a strong interest in using AFM as a nano-manipulator to modify the sample surface or manipulate nano-structures such as nanoparticles. Nano-manipulation using the atomic force microscope has been extensively investigated for many years. It is greatly important to understand the mechanics of AFM-based nanorobotic manipulation for efficient and reliable handling of nanoparticles. The purpose of this paper is to introduce some facilities, nano-manipulation system, some kind of micro-cantilevers, principle of nano-modes, nano-contact mechanic theories and nano-forces in atomic force microscopy.