OTHER
3D-mapping of TMS effects with automatic robotic placement improved reliability and the risk of spurious correlation
Ludovic C. Dormegny-Jeanjean, Lionel Landré, Clément de Crespin de Billy, Olivier Mainberger, Alexandre Obrecht, Benoît Schorr, Camille Pierrat, Golda Gommel, Maciej Bednarczyk, Bernard Bayle, Fabrice Berna, Jack Foucher
- Year
- 2022
- Citations
- 8
Keywords
Reliability (semiconductor)Spurious relationshipCorrelationComputer scienceElectromagnetic coilArtificial intelligenceComputer visionMachine learningMathematicsEngineering
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