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3D-mapping of TMS effects with automatic robotic placement improved reliability and the risk of spurious correlation

Ludovic C. Dormegny-Jeanjean, Lionel Landré, Clément de Crespin de Billy, Olivier Mainberger, Alexandre Obrecht, Benoît Schorr, Camille Pierrat, Golda Gommel, Maciej Bednarczyk, Bernard Bayle, Fabrice Berna, Jack Foucher

发表年份
2022
引用次数
8

关键词

Reliability (semiconductor)Spurious relationshipCorrelationComputer scienceElectromagnetic coilArtificial intelligenceComputer visionMachine learningMathematicsEngineering

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