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Development of a Lifetime Test Bench for Robot Reducers for Fault Diagnosis and Failure Prognostics

Ju Seong Shin, Ju-Hyun Kim, Jong Geol Kim, Maolin Jin

发表年份
2019
引用次数
2

关键词

PrognosticsReliability engineeringFault (geology)Test benchTest (biology)Computer scienceEngineeringArtificial intelligenceEmbedded system

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