Scanning probe microscopy

Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy

Sergei V. Kalinin, Maxim Ziatdinov, Jacob Hinkle, Stephen Jesse, Ayana Ghosh, Kyle P. Kelley, Andrew R. Lupini, Bobby G. Sumpter, Rama K. Vasudevan

Citations: 134 • 2021

Deep learning for electron and scanning probe microscopy: From materials design to atomic fabrication

Sergei V. Kalinin, Maxim Ziatdinov, Steven R. Spurgeon, Colin Ophus, Eric A. Stach, Toma Susi, Josh C. Agar, John N. Randall

Citations: 32 • 2022

Nanomanipulation with the Atomic Force Microscope

Ari Requicha

Citations: 22 • 2010

Position feedback for microrobots based on scanning probe microscopy

A. Bergander, W. Driesen, A.M. Nandhu Lal, T. Varidel, M. Meizoso, Hannes Bleuler, J.‐M. Breguet

Citations: 14 • 2005

AFM Tip Localization and Efficient Scanning Method for MEMS Inspection

Huang-Chih Chen, Yi-Lin Liu, Ching-Chi Huang, Li‐Chen Fu

Citations: 9 • 2022

Development of a Nanohandling Robot Station for Nanocharacterization by an AFM Probe

Sergej Fatikow, Stefan Kray, Volkmar Eichhorn, Saskia Tautz

Citations: 6 • 2006

An integrated image processing approach for 3D scanning and micro-defect detection

Sandesh Birla, Sachin Alya, Ramesh Singh

Citations: 3 • 2022

Novel Water Probe for High-Frequency Focused Transducer Applied to Scanning Acoustic Microscopy System: Simulation and Experimental Investigation

Van Hiep Pham, Le Hai Tran, Jaeyeop Choi, Hoanh-Son Truong, Tan Hung Vo, Dinh Dat Vu, Sumin Park, Junghwan Oh

Citations: 2 • 2024

Concept for the Real-Time Monitoring of Molecular Configurations during Manipulation with a Scanning Probe Microscope

Joshua Scheidt, Alexander C. Diener, Michael Maiworm, Klaus‐Robert Müller, Rolf Findeisen, Kurt Driessens, F. Stefan Tautz, Christian Wagner

Citations: 2 • 2023

Combining scanning microscopy and robotics: Automated analysis and manipulation on the small scale

Malte Bartenwerfer, Tobias Tiemerding, Olaf C. Haenssler, Sergej Fatikow

Citations: 2 • 2017

Advances in Crystallographic Image Processing for Scanning Probe\n Microscopy

Peter Moeck

Citations: 2 • 2020