Yanqing Shi

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About

Dr. Yanqing Shi is a leading figure in optical metrology, specializing in three-dimensional (3D) surface measurement for specular (mirror-like) objects. Her core research focuses on advancing phase measuring deflectometry, a critical technique for high-precision 3D shape acquisition. Dr. Shi’s major contribution lies in overcoming the limitations of traditional methods, particularly through her innovative use of defocused binary fringe patterns. Her 2021 paper, "Infrared phase measuring deflectometry by using defocused binary fringe," which has garnered 14 citations, demonstrates a novel approach that enhances measurement accuracy and robustness for challenging surfaces. This work has direct applications across the automobile industry, aerospace, cultural relic protection, intelligent robotics, and equipment manufacturing, where precise specular surface inspection is vital. By integrating infrared illumination with defocused binary patterns, Dr. Shi has expanded the practical utility of deflectometry, enabling more reliable and efficient 3D data acquisition. Her research is instrumental in bridging the gap between laboratory techniques and real-world industrial demands, making her a key contributor to the field of optical measurement and imaging.