Caixia Chang

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About

Caixia Chang has made significant contributions to optical metrology, with a primary focus on three-dimensional surface measurement for specular objects—a critical challenge in industries such as automotive manufacturing, aerospace, cultural heritage preservation, and intelligent robotics. Her most cited work, "Infrared phase measuring deflectometry by using defocused binary fringe" (2021, 14 citations), introduces an innovative approach that leverages infrared illumination and defocused binary fringe patterns to overcome limitations of traditional visible-light deflectometry. This technique enables robust, high-accuracy acquisition of specular surface topography, even under challenging environmental conditions. Chang's research advances the practical deployment of non-contact optical inspection systems, particularly for complex reflective components. Her work demonstrates a keen ability to merge theoretical phase-measuring principles with real-world engineering constraints, offering scalable solutions for quality control and reverse engineering. By addressing the longstanding difficulty of measuring shiny or mirror-like surfaces, Chang has established herself as a rising figure in applied optics, with her methods poised to impact automated manufacturing and precision metrology. Her ongoing efforts continue to push the boundaries of optical sensing for industrial and scientific applications.