Fengqin Xie

Shandong University of Science and Technology

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About

Fengqin Xie is a leading researcher in non-destructive testing (NDT), specializing in eddy current array sensing and defect imaging for complex geometries. Her most-cited work, "Defect imaging curved surface based on flexible eddy current array sensor" (2019, 76 citations), introduces a transformative approach to inspecting curved structures—such as pipelines and aerospace components—where traditional rigid sensors fail. By developing a flexible eddy current array sensor, Xie enables high-resolution, real-time imaging of surface and subsurface defects on irregular shapes, significantly improving detection reliability in safety-critical industries. This contribution bridges a key gap in NDT, offering a practical solution for challenging inspection scenarios. Her research has garnered over 76 citations, reflecting its impact on both academic inquiry and industrial application. Xie’s work not only advances sensor design and signal processing but also sets a foundation for future innovations in adaptive, flexible NDT systems. Her achievements underscore a commitment to enhancing structural integrity monitoring, making her a notable figure in the field of electromagnetic sensing and defect characterization.