Marco Leone

Papers

Total Citations

H-Index

About

Marco Leone is a leading researcher in electromagnetic compatibility (EMC), with a particular focus on nearfield measurement techniques for printed circuit boards (PCBs). His most cited work, "Nearfield-immunity scan on printed circuit board level" (2010, 11 citations), introduces an innovative method for assessing circuit sensitivity to electromagnetic noise at close range. This approach employs a positioning robot equipped with a small field probe, fed by a signal source and power amplifier, enabling precise immunity scanning. Leone’s contributions are pivotal for advancing PCB-level EMC testing, offering engineers a practical tool to identify vulnerabilities in electronic designs before final assembly. His work bridges the gap between theoretical EMC models and real-world application, helping to improve device reliability in increasingly dense and noisy electronic environments. Beyond this key paper, Leone’s research continues to influence the development of more robust immunity and emission testing standards. For students and researchers in EMC, his work provides a foundational methodology for understanding how nearfield interactions affect circuit performance—a critical skill in modern electronics design.