Mario Krause

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About

Mario Krause is a leading researcher in electromagnetic compatibility (EMC), with a particular focus on nearfield immunity testing and printed circuit board (PCB)-level interference analysis. His most cited work, "Nearfield-immunity scan on printed circuit board level" (2010, 11 citations), introduced a novel method for assessing circuit sensitivity to electromagnetic noise sources in close proximity. By employing a positioning robot equipped with a small field probe, fed by a signal source and a power amplifier, Krause developed a calibrated measurement setup that enables precise, localized immunity scans. This contribution has been instrumental in advancing PCB-level EMC diagnostics, helping engineers identify vulnerable circuit areas during the design phase. His research bridges the gap between theoretical EMC principles and practical, high-resolution testing techniques, making it highly relevant for both academic researchers and industry professionals working on robust electronic system design. Krause’s work continues to influence modern approaches to electromagnetic interference mitigation and nearfield characterization.