Nearfield-immunity scan on printed circuit board level

Abstract

A new immunity scan method is presented for assessing the sensitivity of circuits in close proximity to the nearfield of noise emission sources. The measurement setup primarily consists of a positioning robot with a small field probe, feeded by a signal source and a power amplifier. A suitable calibration method to adjust the interference field strength is suggested. As an application example, the bit-error-ratio of a binary signal transmission is evaluated, depending on the interference field amplitude and the frequency.