A novel AR marker for high-accuracy stable image overlay

Abstract

We developed a novel AR marker which overcomes the biggest problem of conventional AR markers that the accuracy of pose estimation gets worse in frontal observation. We utilize a 2-D moiré pattern which is generated by a microlens array and seems to move according to the visual-line angle. We can extract pose information from the pattern by image processing. The pose accuracy of the marker is less than 1[deg] even in frontal observation. This novel AR marker will be useful in various applications such as measurement, robotics, and AR needing more accurate and stable image overlay.