OTHER
Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook
Marc Botifoll, Ivan Pinto‐Huguet, Jordi Arbiol
- Year
- 2022
- Citations
- 119
Abstract
, high-energy physics, astronomy, Earth sciences, and even robotics, videogames, or marketing and finances), in order to narrow down the incoming future of electron microscopy, its challenges and outlook.
Keywords
Current (fluid)NanotechnologyEngineering physicsEngineering ethicsComputer scienceMaterials scienceEngineeringElectrical engineering
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