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Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook

Marc Botifoll, Ivan Pinto‐Huguet, Jordi Arbiol

发表年份
2022
引用次数
119

摘要

, high-energy physics, astronomy, Earth sciences, and even robotics, videogames, or marketing and finances), in order to narrow down the incoming future of electron microscopy, its challenges and outlook.

关键词

Current (fluid)NanotechnologyEngineering physicsEngineering ethicsComputer scienceMaterials scienceEngineeringElectrical engineering

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