OTHER
Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook
Marc Botifoll, Ivan Pinto‐Huguet, Jordi Arbiol
- 发表年份
- 2022
- 引用次数
- 119
摘要
, high-energy physics, astronomy, Earth sciences, and even robotics, videogames, or marketing and finances), in order to narrow down the incoming future of electron microscopy, its challenges and outlook.
关键词
Current (fluid)NanotechnologyEngineering physicsEngineering ethicsComputer scienceMaterials scienceEngineeringElectrical engineering
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