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Recent advances in nanorobotic manipulation inside scanning electron microscopes

Chaoyang Shi, Devin K. Luu, Qinmin Yang, Jun Liu, Jun Chen, Changhai Ru, Shaorong Xie, Jun Luo, Ji Ge, Yu Sun

发表年份
2016
引用次数
184
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摘要

A scanning electron microscope (SEM) provides real-time imaging with nanometer resolution and a large scanning area, which enables the development and integration of robotic nanomanipulation systems inside a vacuum chamber to realize simultaneous imaging and direct interactions with nanoscaled samples. Emerging techniques for nanorobotic manipulation during SEM imaging enable the characterization of nanomaterials and nanostructures and the prototyping/assembly of nanodevices. This paper presents a comprehensive survey of recent advances in nanorobotic manipulation, including the development of nanomanipulation platforms, tools, changeable toolboxes, sensing units, control strategies, electron beam-induced deposition approaches, automation techniques, and nanomanipulation-enabled applications and discoveries. The limitations of the existing technologies and prospects for new technologies are also discussed.

关键词

NanotechnologyCharacterization (materials science)Materials scienceComputer science

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