Myongsoo Kim
Papers
1
Total Citations
4
H-Index
1
About
Myongsoo Kim is a precision engineering researcher whose work focuses on metrology and surface characterization for advanced manufacturing. His primary research areas include contact-type measurement probes, gear metrology, and roughness evaluation for ultra-fine-pitch components. Kim’s major contribution lies in the development of a novel contact-type probe designed specifically for measuring ultra-fine-pitch gears, a critical need in high-precision industries such as micro-machinery and automotive engineering. His 2017 paper on this probe, which has garnered 4 citations, introduces a method for pseudo roughness evaluation that enhances the accuracy and reliability of gear surface measurements. This work addresses challenges in miniaturized gear production, where traditional measurement techniques fall short. Kim’s research has implications for improving quality control in precision manufacturing, and his probe design represents a practical tool for engineers working with micro-scale components. While his citation count is modest, his targeted contributions to gear metrology are valued in niche industrial applications, demonstrating a focused impact on solving real-world measurement problems.
Research Focus
Key Achievements
Top Papers
- 1