Chun‐Yu Lin
Papers
1
Total Citations
3
H-Index
1
About
Chun‐Yu Lin’s research centers on high-voltage integrated circuit design, electrostatic discharge (ESD) protection, and power management for emerging applications like robotics and automotive electronics. His most cited work, a 2017 paper on a high-voltage driving circuit with on-chip ESD protection in CMOS technology, introduces a robust solution for motor controllers in robots. By integrating a novel ESD protection scheme directly into the driving circuit, Lin significantly enhances system reliability against electrical overstress—a critical challenge in high-power environments. This contribution, which has garnered 3 citations, exemplifies his focus on bridging performance and durability in advanced CMOS platforms. Beyond this flagship study, Lin’s broader portfolio addresses the intersection of high-voltage driving and on-chip safety, laying groundwork for more resilient power electronics. His work is particularly notable for its practical impact on industrial automation and consumer robotics, where dependable high-voltage operation is paramount. As a researcher, Lin continues to push the boundaries of integrated circuit reliability, making his findings essential reading for engineers and students developing next-generation motor control and power systems.
Research Focus
Key Achievements
Top Papers
- 1