Home /Research /A 40-nm Embedded SG-MONOS Flash Macro for High-End MCU Achieving 200-MHz Random Read Operation and 7.91-Mb/mm<sup>2</sup> Density With Charge-Assisted Offset Cancellation Sense Amplifier
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A 40-nm Embedded SG-MONOS Flash Macro for High-End MCU Achieving 200-MHz Random Read Operation and 7.91-Mb/mm<sup>2</sup> Density With Charge-Assisted Offset Cancellation Sense Amplifier

Masaya Nakano, Yoshinobu Kaneda, Satoru Nakanishi, Yasumitsu Murai, Yosuke Tashiro, Yasuhiko Taito, Tomoya Ogawa, Hidenori Mitani, Takashi Ito, Takashi Kono

Year
2022
Citations
10

Abstract

With the expansion of Internet of Things (IoT) by artificial intelligence (AI), there is a strong demand for higher performance, higher intelligence, and lower cost in endpoint devices for crossover area located at the boundary between high-end micro controller unit (MCU) area and low-end micro processor unit (MPU) area, such as home automation, machine vision, robotics, and so on. This article presents a 40-nm embedded split-gate MONOS (SG-MONOS) flash macro with optimized memory array architecture and charge-assisted offset cancellation sense amplifier (CAOC-SA), which achieve high-speed random read operation of 200 MHz and high density of 7.91 Mb/mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> suitable for crossover devices.

Keywords

MicrocontrollerOffset (computer science)Electrical engineeringCMOSFlash (photography)Flash memoryComputer scienceComputer hardwarePhysicsEngineering

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