Home /Research /Quantifying the localized electrical interface using a force-controlled scanning ion conductance microscopy.
PERCEPTION

Quantifying the localized electrical interface using a force-controlled scanning ion conductance microscopy.

Wang H, Shi H, Tang S, Wang D, Yu P, Su C, Liu L

Year
2026
Journal
Journal of colloid and interface science

Keywords

scanning ion conductance microscopyforce controlelectrical interfacelocalized measurement

Related papers

Browse all PERCEPTION papers